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Bias-temperature-instabilities In Mosfets With High-k Dielectrics

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Subthreshold Surface Potential Model For Short-channel Mosfet Using

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Growth Of High Permittivity Dielectrics By High Pressure Sputtering

Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics, Fachbücher von Guido Groeseneken, Marc Aoulaiche, Her...